החיפוש מתבצע באנגלית בלבד.
ניתן להשתמש ב AND/OR בכדי להרחיב את החיפוש.
ניתן למקד את החיפוש בעזרת הקודים הבאים:
| Field Name | Field Code |
|---|---|
| Patent Number | PN |
| Title | TTL |
| Abstract | ABST |
| Claim(s) | ACLM |
| Description/Specification | SPEC |
| Current US Classification | CCL |
| International Classification | ICL |
| Application Serial Number | APN |
| Application Date | APD |
| Parent Case Infromation | PARN |
| Related US App. Data | RLAP |
| Reissue Data | REIS |
| Foreign Priority | PRIR |
| PCT Information | PCT |
| Application Type | APT |
| Inventor Name | IN |
| Inventor City | IC |
| Inventor State | IS |
| Inventor Country | ICN |
| Attorney or Agent | LREP |
| Assignee Name | AN |
| Assignee City | AC |
| Assignee State | AS |
| Assignee Country | ACN |
| Primary Examiner | EXP |
| Assistant Examiner | EXA |
| Referenced By | REF |
| Foreign References | FREF |
| Other References | OREF |
| Government Interest | GOVT |